Powder XRD Characterization offers a quick and accurate testing method for crystalline materials. Powder X-ray Diffraction Analytical Service provides reliable identification of unknown materials with a high degree of accuracy and repeatability. This method is fast and cost-effective.

Starting from $50 per sample, MSE Analytical Services offer professional powder XRD analytical service using Rigaku MiniFlex, Bruker D8 and X'Pert Pro MPD, or similar instrument. Rush service with 1-2 days data delivery is available at an extra cost of $50 per sample.

Regular scan (5 degrees per minute, 10 - 80 degrees) powder XRD: $45 per sample
Slow scan (2 degrees per minute, 10 - 80 degrees) powder XRD: $70 per sample
Ultra slow scan (1 degree per minute, 10 - 80 degrees) powder XRD: $100 per sample
Small-angle XRD (0.5 to 1 degree per minute, 0.5 - 10 degrees): $85 per sample
Rush service with 1-2 days data delivery after receiving the samples: extra $50 per sample

Before shipping samples to us, please contact analytical@msesupplies.com to provide the SDS and confirm the sample requirements. This will help to avoid unnecessary delays in sample processing.

* Note: Data analysis service is not included in the above list prices.

Data Processing Service: XRD background subtraction and identification of crystalline phases through the database (quantitative data analysis excluded). Cost: Please contact us for a quote.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Please contact our scientists to discuss your sample characterization requirements. Email: analytical@msesupplies.com

X-ray diffraction (XRD) is one of the most important materials characterization tools. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control.

X-ray diffraction (XRD) characterization is a powerful nondestructive technique for characterizing crystalline materials. It provides information on crystal structure, phase, preferred crystal orientation (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays diffracted at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the X-ray diffraction pattern is the fingerprint of the periodic atomic arrangements in a given material. A search of the ICDD (International Centre for Diffraction Data) database of X-ray diffraction patterns enables the phase identification of a large variety of crystalline samples.

Powder X-ray diffraction analytical service is most widely used for the identification of unknown crystalline materials (e.g. minerals, inorganic compounds). Determination of unknown solids is critical to studies in geology, environmental science, material science, engineering and biology. The applications include:

Characterization of crystalline materials
Identification of fine-grained minerals such as clays and mixed layer clays that are difficult to determine optically
Determination of unit cell dimensions
Measurement of sample purity
Determine crystal structures using Rietveld refinement
Determine of modal amounts of minerals
Characterize thin films samples by:

determining lattice mismatch between film and substrate and to inferring stress and strain
determining dislocation density and quality of the film by rocking curve measurements
measuring superlattices in multilayered epitaxial structures
determining the thickness, roughness and density of the film using glancing incidence X-ray reflectivity measurements

make textural measurements, such as the orientation of grains, in a polycrystalline sample