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High-End Electron Microscopy Testing

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Focused Ion Beam Scanning Electron Microscopy (FIB Sample Preparation/FIB + SEM/FIB + TEM/FIB + Spherical Aberration Correction) - MSE Supplies LLC

Focused Ion Beam Scanning Electron Microscopy (FIB Sample Preparation/FIB + SEM/FIB + TEM/FIB + Spherical Aberration Correction)
$ 3,28495
Mineral Liberation Analysis (MLA) System - MSE Supplies LLC

Mineral Liberation Analysis (MLA) System
$ 3,19595
Spherical Aberration Corrected Transmission Electron Microscope Analytical Service - MSE Supplies LLC

Spherical Aberration Corrected Transmission Electron Microscope Analytical Service
$ 2,19995