MCAS002_XRF Characterization, X-ray Fluorescence Spectroscopy Analytical Services | MSE Supplies
Starting from $34 per sample, MSE Supplies offers professional XRF characterization services using PANalytical Axios XRF instrument.
Please contact our materials scientists to discuss your sample analysis requirements. Email: email@example.com
2. When an atom in the sample is struck with an X-ray of sufficient energy (greater than the atom’s K or L shell binding energy), an electron from one of the atom’s inner orbital shells is dislodged.
3. The atom regains stability, filling the vacancy left in the inner orbital shell with an electron from one of the atom’s higher energy orbital shells.
4. The electron drops to the lower energy state by releasing a fluorescent X-ray. The energy of this X-ray is equal to the specific difference in energy between two quantum states of the electron. The measurement of this energy is the basis of XRF analysis.
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