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100 mm Intrinsic Test Grade Silicon Wafer <100>, SSP, >20000 ohm-cm - MSE Supplies LLC

MSE PRO 100 mm Intrinsic Test Grade Silicon Wafer <100>, SSP, >20000 ohm-cm

  • $ 9355
  • Save $ 495
Qty (Each) Price (Each)
1 - 4 $ 93.55
5 - 9 $ 73.95
10 - 24 $ 68.55
25 - 25+ $ 63.55

MSE PRO™ 100 mm Intrinsic Test Grade Silicon Wafer <100>, > 20000 ohm-cm, Single Side Polished, 4 inch Si Wafer

Product SKU#: WA0810

Product Specifications

  • Material: Single Crystal Silicon Wafer
  • Growth Method: FZ
  • Orientation: <100>
  • Diameter: 100 mm +/- 0.5 mm
  • Thickness: 525 um +/- 25 um (SSP)
  • Flat: 1 SEMI Standard
  • Type/ Dopant: Intrinsic / Undoped
  • Resistivity: > 20000 ohm-cm
  • TTV: < 10 µm
  • WARP: < 30 µm
  • BOW: < 30 µm
  • Particle: < 20 @ 0.3  µm
  • Front Surface: CMP Polished, Ra < 0.5 nm (single side polished, SSP)

Test grade wafers are very similar to prime wafers. Their flatness (TTV,BOW,WARP), cleanliness (particles), and other specifications are usually less rigorous than prime wafers, but still more than enough for testing equipments and can be applied to many industries. As a more affordable option, they are often used in equipment and fabrication testing projects that require a large quantity of wafers.

Please contact us if you need to place bulk orders or need customization.

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