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Infrared reflectance/emissivity/diffuse reflectance testing
Atomic Absorption Spectrometer (AAS) Analytical Service
Femtosecond Transient Absorption Spectrometer (fs-TAS) Analytical Service
Mössbauer Spectrometer Analytical Service
X-ray Small-Angle Scattering/Wide-Angle Scattering (SAXS/WAXS) Analytical Service
Positron Annihilation Lifetime Spectrometer (PAT) Analytical Service
Focused Ion Beam Scanning Electron Microscopy (FIB Sample Preparation/FIB + SEM/FIB + TEM/FIB + Spherical Aberration Correction)
Mineral Liberation Analysis (MLA) System
Spherical Aberration Corrected Transmission Electron Microscope Analytical Service
In-Situ Electron Backscatter Diffraction (EBSD) Analytical Service
In-Situ Scanning Electron Microscopy (SEM) Analytical Service
In-Situ X-ray Photoelectron Spectroscopy (XPS) Analytical Service
Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) Analytical Service
Three-Dimensional Atom Probe Technology (APT) Analytical Service
Glow Discharge Optical Emission Spectroscopy/Mass Spectrometry (GD-OES/MS) Analytical Service
Synchrotron X-ray Scattering (SAXS/WAXS) Analytical Service
Synchrotron Atomic Pair Distribution Function (PDF) Analytical Service
Synchrotron X-ray Diffraction (XRD) Analytical Service
X-Ray Absorption Fine Structure (XAFS) Analytical Service
Differential Scanning Calorimetry (DSC) Analytical Service
