Thin Film and Coating XRD, Grazing Incidence X-ray Diffraction (GIXRD) Analytical Service

Characterization of the crystalline structure of thin films and coatings by XRD.  MSE Analytical Services offer professional Grazing Incidence X-ray Diffraction (GIXRD) Analytical Service using the Bruker D8 XRD instrument. 

GIXRD can measure a crystalline structure of thin films and coatings by using small incident angles for the incoming X-ray beam, so that diffraction can be made surface sensitive. It is used to study surfaces and layers because X-ray wave penetration is limited only to the surface thin film or coating layer. 

Measurement services:

• Thin film sample GIXRD (5 degrees per minute, 5 - 90 degrees): $100 per sample
• Coating sample GIXRD (5 degrees per minute, 5 - 90 degrees): $130 per sample
  

For other test conditions, please contact us for a quote.

* Note: Data analysis service is not included in the above list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order. 

***Please do not ship any samples without authorization from MSE Supplies***