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Special X-ray Photoelectron Spectroscopy (XPS) Testing Analytical Service
Optical Emission Spectrometer (OES) Analytical Service
Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer (MALDI-TOF/TOF)
Two-Dimensional Wide-Angle X-ray Diffraction (2D-WAXD) Analytical Service
Micro-area X-ray Diffraction (Micro-XRD) Analytical Service
High-Resolution X-ray Diffraction (HRXRD) Analytical Service
Infrared reflectance/emissivity/diffuse reflectance testing
Atomic Absorption Spectrometer (AAS) Analytical Service
Femtosecond Transient Absorption Spectrometer (fs-TAS) Analytical Service
Mössbauer Spectrometer Analytical Service
X-ray Small-Angle Scattering/Wide-Angle Scattering (SAXS/WAXS) Analytical Service
Positron Annihilation Lifetime Spectrometer (PAT) Analytical Service
Focused Ion Beam Scanning Electron Microscopy (FIB Sample Preparation/FIB + SEM/FIB + TEM/FIB + Spherical Aberration Correction)
Mineral Liberation Analysis (MLA) System
Spherical Aberration Corrected Transmission Electron Microscope Analytical Service
In-Situ Electron Backscatter Diffraction (EBSD) Analytical Service
In-Situ Scanning Electron Microscopy (SEM) Analytical Service
In-Situ X-ray Photoelectron Spectroscopy (XPS) Analytical Service
Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) Analytical Service
Three-Dimensional Atom Probe Technology (APT) Analytical Service
