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Thin Film and Coating XRD, Grazing Incidence X-ray Diffraction (GIXRD) Analytical Service

  • $ 10000


Characterization of the crystalline structure of thin films and coatings by XRD.  MSE Analytical Services offer professional Grazing Incidence X-ray Diffraction (GIXRD) Analytical Service using the Bruker D8 XRD instrument. 

GIXRD can measure a crystalline structure of thin films and coatings by using small incident angles for the incoming X-ray beam, so that diffraction can be made surface sensitive. It is used to study surfaces and layers because X-ray wave penetration is limited only to the surface thin film or coating layer. 

Requirements for samples:

  • Typical length and width: 10 mm x 10 mm
  • Thin film or coating thickness > 5 nm 

Measurement services:

  • Thin film sample GIXRD (5 degrees per minute, 5 - 90 degrees): $100 per sample
  • Coating sample GIXRD (5 degrees per minute, 5 - 90 degrees): $130 per sample
For other test conditions, please contact us for a quote.

    * Note: Data analysis service is not included in the above list prices.

    Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

    Please contact our scientists to discuss your sample characterization requirements. Email: analytical@msesupplies.com