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SEM-EDS Characterization | SEM-EDS Analytical Service, MSE Supplies

SEM-EDS Characterization | SEM-EDS Analytical Service

  • $ 8500

Starting from $85 per sample (SEM only), MSE Analytical Services offer professional SEM-EDS characterization service using Phenom ProX Desktop SEM equipped with EDS from our lab located in Tucson, Arizona, USA.

Rush service is available with one day data delivery: extra $100 per sample

Non-magnetic sample SEM only: $85 per sample

Magnetic sample SEM only: $125 per sample

SEM + EDS spot: +$35 per sample

SEM + EDS mapping: +$55 per sample

* Note: Data analysis service is not included in the list prices. Please contact us for a quote on SEM-EDS data analysis and reporting services. 

Statistical particle size analysis based on SEM image analysis algorithms is available upon request. The cost is $125 per sample for both the statistical particle size analysis and a PDF report of the statistical results and particle size distribution graphs. 

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Please contact our scientists to discuss your sample characterization requirements. Email: analytical@msesupplies.com

Specifications of Phenom ProX Desktop SEM

Desktop SEM with EDS capability for robust, effortless, and versatile elemental and SEM analysis.

Light optical magnification
  • 20–134x
Electron optical magnification range
  • 80-150,000x
Resolution
  • ≤ 6 nm SED and ≤ 8 nm BSD
Digital zoom
  • Max. 12x
Light optical navigation camera
  • Color
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum modes
  • High vacuum mode
  • Charge reduction mode via optional low vacuum sample holder
Detectors
  • Backscattered electron detector
  • Energy-dispersive X-ray detector
  • Secondary electron detector
Sample size
  • Up to 25 mm diameter (optional 32 mm)
Sample height
  • Up to 35 mm (optional 100 mm)