Powder XRD Characterization, Powder X-ray Diffraction Analytical Service
Starting from $40 per sample, MSE Analytical Services offer professional powder XRD analytical service using Rigaku MiniFlex, Bruker D8 and X'Pert Pro MPD, or similar instrument. Rush service with 1-2 days data delivery is available at an extra cost of $50 per sample.
Regular scan (5 degrees per minute, 10 - 80 degrees) powder XRD: $40 per sample
Slow scan (2 degrees per minute, 10 - 80 degrees) powder XRD: $60 per sample
Ultra slow scan (1 degree per minute, 10 - 80 degrees) powder XRD: $80 per sample
Small-angle XRD (0.5 to 1 degree per minute, 0.5 - 10 degrees): $75 per sample
* Note: D
Please contact our scientists to discuss your sample characterization requirements. Email: firstname.lastname@example.org
X-ray diffraction (XRD) is one of the most important materials characterization tools. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control.
X-ray diffraction (XRD) characterization is a powerful nondestructive technique for characterizing crystalline materials. It provides information on crystal structure, phase, preferred crystal orientation (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays diffracted at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the X-ray diffraction pattern is the fingerprint of the periodic atomic arrangements in a given material. A search of the ICDD (International Centre for Diffraction Data) database of X-ray diffraction patterns enables the phase identification of a large variety of crystalline samples.
- Characterization of crystalline materials
- Identification of fine-grained minerals such as clays and mixed layer clays that are difficult to determine optically
- Determination of unit cell dimensions
- Measurement of sample purity
- Determine crystal structures using Rietveld refinement
- Determine of modal amounts of minerals
- Characterize thin films samples by:
- determining lattice mismatch between film and substrate and to inferring stress and strain
- determining dislocation density and quality of the film by rocking curve measurements
- measuring superlattices in multilayered epitaxial structures
determining the thickness, roughness and density of the film using glancing incidence X-ray reflectivity measurements
- make textural measurements, such as the orientation of grains, in a polycrystalline sample
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