AFM Characterization, Atomic Force Microscopy Imaging Analytical Service
Starting at $175 per sample, MSE Supplies offers professional Atomic Force Microscopy (AFM) characterization services using Bruker Dimension ICON2-SYS AFM or similar instrument.
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Please contact our scientists to discuss your sample characterization requirements. Email: firstname.lastname@example.org
AFM analysis measures materials surface topography with atomic resolution. It is capable of quantifying surface roughness of samples down to the angstrom-scale. In addition to presenting a surface image, AFM can also provide quantitative measurements of feature sizes, such as step heights and other dimensions. Additionally, advanced modes of AFM allow for the qualitative mapping of various other physical properties, such as adhesion, modulus, dopant distribution, conductivity, surface potential, electric field, and magnetic domains.