Overview

In-situ scanning electron microscopy (SEM) is an electron microscopy technique that allows real-time observation and analysis of samples under in-situ conditions, such as temperature changes, stretching, and compression. By collecting and analyzing various types of information during in-situ experiments, this technique enables the study of the sample's microscopic morphology, composition, and crystal orientation, as well as its macroscopic properties, such as mechanical and thermodynamic characteristics. It is primarily applied in fields such as materials science, nanotechnology, and biological sciences.

In-situ testing under tensile, compressive, and variable temperature conditions is available.
Currently, the available temperature range extends from a minimum of -180℃ to a maximum of 1500℃.

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Note: The listed price is for reference only. Please request a quote for the final pricing.

Analytical Service Minimum order requirement: $250 per order. A $200 handling fee will be applied if order is below $250.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order.

***Please do not ship any samples without authorization from MSE Supplies***

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