XPS-ESCA/XPS Characterization is an advanced analytical technique used to provide valuable chemical information about the composition, elemental and chemical state of the surface of materials. Using the innovative XPS-ESCA technology, our laboratory's skilled technicians provide highly-accurate elemental surface composition analysis and chemical state analysis.

XPS (X-ray Photoelectron Spectroscopy)

XPS, short for X-ray Photoelectron Spectroscopy, is a surface-sensitive analytical technique that measures the energy distribution of photoelectrons and Auger electrons emitted from a sample surface when it is irradiated with X-ray photons using an electron spectrometer.

XPS is widely used for both qualitative and semi-quantitative analysis.
By analyzing the peak positions and shapes in the XPS spectrum, information can be obtained about a sample’s surface elemental composition, chemical states, and molecular structure.
The peak intensity can be used to estimate elemental content or concentration on the surface.

Typical Applications of XPS:

Elemental Composition Analysis
For unknown samples, a survey scan is typically performed first to identify the elements present on the surface.
Based on the survey results, high-resolution narrow scans are then carried out within specific binding energy ranges to precisely determine the peak positions of the target elements.
Chemical State Analysis
XPS can detect chemical shifts in the binding energies of core electrons, which reflect the chemical bonding and electron distribution of the atoms.
This allows inference of the oxidation state and chemical environment of elements.
Semi-Quantitative Analysis
In addition to qualitative analysis (elemental and chemical state identification), XPS can be used for semi-quantitative analysis, as there is a correlation between photoelectron peak intensity and elemental concentration.
Although XPS is not typically used for absolute quantification, it provides reliable semi-quantitative elemental information.
Depth Profiling
XPS can also perform depth profiling through techniques such as argon ion sputtering, mechanical sectioning, or varying the take-off angle.
This enables compositional and chemical state analysis of thin films over a defined depth range, providing insight into material uniformity and elemental spatial distribution.

XPS Testing Guidelines and Sample Requirements

Sample Requirements:
- Powder samples: Please provide 20–30 mg. If the quantity is limited, wrap the sample in aluminum foil before placing it in a container for shipment.
- Bulk or film samples: Dimensions should not exceed 5 × 5 × 3 mm. If glovebox sample preparation is required, the sample height must not exceed 2 mm.
Testing Notes:
- Elements with atomic concentrations below 5 at.% may not produce a detectable signal.
- Narrow scan (high-resolution) measurements will be performed on the most intense orbital peak by default.
- H and He cannot be detected by XPS.
- For radioactive elements, please contact us in advance.
Data Delivery:
- We will provide raw data only by default.
- No correction or smoothing will be applied, as correction methods vary by material.
Number of Test Locations:
- By default, one location per sample is tested.
- If multiple spots need to be tested, each location is treated as a separate sample and will be charged accordingly.
- For films and bulk samples, surface inhomogeneity may lead to variations in test results.
Peak Overlaps with Al Kα X-rays:
- Peak overlaps may occur, affecting the reliability of direct quantification from the peak table.
- Common overlapping peaks include:
  - Li 1s & Co 3p
  - B 1s & P 2s
  - C 1s & Ru 3d5/2, Ru 3d3/2
  - C 1s & K 2p
  - O 1s & Na KLL
Special Requests:
- Samples containing elemental S, F, I, Br, Hg, Cl, P, or other sensitive elements may not be testable in their pure form.
- For special cases, please contact: analytical@msesupplies.com
Packaging Requirements:
- Once prepared, samples should be vacuum-sealed whenever possible to minimize contamination from air.
- This is especially important when testing elements such as C and O, which are easily affected by environmental exposure.
Retesting Fees:
- If inconsistent results arise due to sample inhomogeneity, additional fees will apply for retesting.
Sample Recovery:
- Powder samples are fixed to the sample holder using double-sided tape and cannot be recovered after testing.
- Bulk samples may also be damaged or contaminated, so recovery is generally not recommended.
Instrument Resolution:

The XPS system has a resolution of ≤ 0.5 eV. A deviation of up to 0.5 eV between repeated measurements at the same position is considered normal.

X-ray Source:

Aluminum (Al) target is used as the default X-ray source for analysis.

Analytical Service Minimum order requirement: $250 per order. A $200 handling fee will be applied if order is below $250.

MSE Analytical Services offer professional XPS characterization services using Thermo Scientific ESCALAB 250Xi and Kratos AXIS-ULTRA DLD-600W

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order.

***Please do not ship any samples without authorization from MSE Supplies***

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