MSE PRO Research Upright Metallurgical Microscope

MSE PRO™ Research Upright Metallurgical Microscope

MSE PRO™ OM0044 Trinocular Metallurgical Microscope for Reflected (with PL10X/25mm eyepiece, 0-35° inclined trinocular viewing head, 5X, 10X, 20X infinite LWD plan BD semi-APO objectives, 50X, 100X infinite LWD plan BD APO objectives, Reflected light with 5W LED lamp, Koehler illumination, with 6 position turret, ECO function), Polarizing Kit for Reflected illumination, DIC kit,1X C-mount, Centering telescope.

Application:

OM0044 series microscopes are widely used in institutes and laboratories to observe and identify the structure of various metal and alloy, it also can be used in electronics, chemical and semiconductor industry, such as wafer, ceramics, integrated circuits, electronic chips, printed circuit boards, LCD panels, film, powder, toner, wire, fibers, plated coatings, other non-metallic materials and so on.

Features:

• Excellent Infinite Optical System.
  • With the excellent infinite optical system, OM0044 series upright metallurgical microscope provides high resolution, high definition and chromatic aberration corrected images which could display the details of your specimen very well.
• Modular Design.
  • OM0044 series microscopes have been designed with modularity to meet various industrial and material science applications. It gives users flexibility to build a system for specific needs.
• ECO Function.
  • The microscope light will be off automatically after 15 minutes from operators leaving. It not only saves energy, but also saves the lamp lifetime. 
• Comfortable and Easy to Use.
  • NIS45 Infinite Plan Semi-APO and APO Objectives. 
    With high transparent glass and advanced coating technology, NIS45 objective lens can provide high resolution images and accurately reproduce the natural color of the specimens. For special applications, a variety of objectives are available, including polarizing and long working distance.
    
  • Nomarski DIC. 
    With newly designed DIC module, the height difference of a specimen which cannot be detected with brightfield becomes a relief-like or 3D image. It is ideal for the observation of LCD conducting particles and the surface scratches of hard disk etc.
    
  • Focusing System. 
    In order to make the system suitable for the operating habits of the operators, the knob of focusing and stage can be adjusted to the lefthand side or right-hand side. This design makes the operation more comfortable.
    
  • Ergo Tilting Trinocular Head. 
    Eyepiece tube can be adjustable from 0 ° to 35 °， Trinocular tube can be connected to DSLR camera and digital camera, having a 3-postion beam splitter (0:100, 100:0, 80:20), the splitter bar can be assembled on either side according to user's requirement.
    
• Various Observation Methods.
  • Darkfield (Wafer) 
    Darkfield enables the observation of scattered or diffracted light from the specimen. Anything that is not flat reflects this light while anything that is flat appears dark, so imperfections clearly stand out. The user can identify the existence of even a minute scratch or flaw down to the 8nm level smaller than the resolving power limit of an optical microscope. Darkfield is ideal for detecting minute scratches or flaws on a specimen and examining mirror surface specimens, including wafers.
  • Differential Interference Contrast (Conducting Particles) 
    DIC is a microscopic observation technique in which the height difference of a specimen not detectable with brightfield becomes a relief-like or three dimensional image with improved contrast. This technique utilizes polarized light and can be customized with a choice of three specially designed prisms. It is ideal for examining specimens with very minute height differences, including metallurgical structures, minerals, magnetic heads, hard-disk media and polished wafer surfaces.
    
  • Transmitted Light Observation (LCD) 
    For transparent specimens such as LCDs, plastics, and glass materials, transmitted light observation is available by using a variety of condensers. Examining specimens in transmitted brightfield and polarized light can be accomplished all in one convenient system.
    
  • Polarized Light (Asbestos) 
    This microscopic observation technique utilizes polarized light generated by a set of filters (analyzer and polarizer). The characteristics of the sample directly affect the intensity of the light reflected through the system. It is suitable for metallurgical structures (i.e., growth pattern of graphite on nodular casting iron), minerals, LCDs and semiconductor materials.
    

Specifications:

Note: ●Standard parts,  ○Optional parts