ACZET Stark X-Ray Fluorescence (XRF) Analyzer
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ACZET Stark X-Ray Fluorescence (XRF) Analyzer
Overview
The engineering result of years of product development and user feedback the Stark provides fast, easy and high-performance XRF analysis designed to meet even the strictest customer specifications. A smart compact design makes analysis convenient for a variety of applications all at an affordable price to maximize your quality control ROI.
Stark is a non-destructive solution that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, and powders.
Stark Being a robust solution, combining high precision and accuracy can be readily automated for use in any industrial environments thus making it.
- Powerful Analysis With Smart Design
- Easy and Simple User Interface
- Compact, Convenient, Power and Performance.
With many advantages over competing products and technologies, Stark delivers an best performance, a wide analysis range, and the best repeatability in the industry.
Product
The development of benchtop XRF instruments has greatly expanded the range of samples suitable for analysis. The Bottom to Top X-Ray helps in direct exposure of rays on the samples thus making easy positioning of samples.
Auto Focus
Being Auto Focus Stark XRF makes a simple and fast for sample positioning which helps in saving time for those requiring continuous operation.
X-Ray Tube
Stark family are available in several versions that differ with regard to X-Ray tubes, detectors. An option of Proportional counter tube, silicon PIN diode or Silicon drift detector as X-Ray detector is offer in Stark Series. Our X-Ray tubes are known for their performance and long life, making our XRF Machine an ideal solution for demanding applications for those requiring continuous operation.
Secure Non Editable Software
X-Master software is user friendly and easy to use with non-editable results. X-Master is the heart of all MSE Supplies X-Ray instruments, enabling the collection of information regarding precious metals, coating thickness and material analysis. X-Master has both Empirical and Fundamental method of measurement.
X-Master has ease for creation of required application for coating thickness.
Software
X-Master is the user-friendly operating software for the modern suit of X-ray systems. This program used most modern software tools available for Windows operating platforms. The main task of the operating software is the control of all system parameters such as high voltage settings, X-ray tube current, display of collimators and filters as well as the collection of the measurement data.
- Empirical calibration mode for calibrating unit using well assessed standard samples.
- Fundamental calibration mode for standard free calibrations.
- Simultaneous quantitative measurement up to 8 elements.
- Qualitative material identification up to 20 elements.
- Spectrum analysis for semi-quantitative concentration measurement.
- Statistical functions with mean value, standard deviation, high/low reading, trend line etc.
Calibration
- Pre-calibrated for Gold and other precious metals.
Product Specification
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Model |
High performance SDD |
High Resolution SI-PIN |
Silicon Drift Detector (SDD) |
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Measuring Direction |
Bottom to Top |
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Applied Application |
Gold & Silver Analysis in jewellery and alloys, Coating Thickness Measurement on Metals |
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X-ray Tube |
Mini-focus, high performance, |
Long Life, High efficiency, tungsten target air cooled |
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High Voltage |
50kV (1.2mA) Software Control Optimized |
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Detector |
High resolution Gas Filed Prop Counter |
High resolution Silicon Pin Detector |
Silicon Drift Detector |
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Measurement Time |
60 sec. to 180 sec. |
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Collimator |
0.3mmØ or 0.5mmØ, Optional four positions Collimator changer |
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Sample Stage |
Fixed Sample Positioning |
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Power Supply |
230VAC, 50/60Hz, 120W / 100W |
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Inside Chamber |
330 x 200 x 170 mm (WxDxH) |
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Dimension |
350 x 450 x 310 mm (WxDxH) |
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Weight |
32 kg |
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