Characterization of the crystalline structure of thin films and coatings by XRD. MSE Analytical Services offer professional Grazing Incidence X-ray Diffraction (GIXRD) Analytical Service using the Bruker D8 XRD instrument.

GIXRD can measure a crystalline structure of thin films and coatings by using small incident angles for the incoming X-ray beam, so that diffraction can be made surface sensitive. It is used to study surfaces and layers because X-ray wave penetration is limited only to the surface thin film or coating layer.

Requirements for samples:

Typical length and width: 10 mm x 10 mm
Thin film or coating thickness > 5 nm

Measurement services:

Thin film sample GIXRD (5 degrees per minute, 5 - 90 degrees): $100 per sample
Coating sample GIXRD (5 degrees per minute, 5 - 90 degrees): $130 per sample

For other test conditions, please contact us for a quote.

* Note: Data analysis service is not included in the above list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Before shipping samples to us, please contact analytical@msesupplies.com to provide the SDS and confirm the sample requirements. This will help to avoid unnecessary delays in sample processing.